Thickness Dependence of Structure and Piezoelectric Properties at Nanoscale of Polycrystalline Pzt Thin Films

AuthID
P-00G-9SP
4
Author(s)
Araujo, EB
·
Lima, EC
·
Bdikin, IK
·
Tipo de Documento
Proceedings Paper
Year published
2012
Publicado
in 2012 INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS HELD JOINTLY WITH 11TH IEEE ECAPD AND IEEE PFM (ISAF/ECAPD/PFM) in IEEE International Symposium on Applications of Ferroelectrics, ISSN: 1099-4734
Conference
21St Ieee International Symposium on Applications of Ferroelectrics Held Jointly with 11Th European Conference on the Applications of Polar Dielectrics and 4Th Conference on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Date: JUL 09-13, 2012, Location: Aveiro, PORTUGAL, Patrocinadores: IEEE, IEEE, Ultrason, Ferroelect & Frequency Control (UFFC) Soc, Host: Univ Aveiro
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Publication Identifiers
Wos: WOS:000313016400125
Source Identifiers
ISSN: 1099-4734
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