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Adc Built-In-Self-Test Based on a Pseudorandom Uniform Noise Generator

AuthID
P-00G-EP0

Author(s)

Evans, G

Tipo de Documento

Proceedings Paper

Year published

2014

Publicado

in Proceedings of the 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014

Conference

2014 29Th Conference on Design of Circuits and Integrated Systems, Dcis 2014, Date: 26 November 2014 through 28 November 2014, Patrocinadores: ETSI Industriales;Xilinx

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Fontes

Publication Identifiers

DOI: 10.1109/dcis.2014.7035596

SCOPUS: 2-s2.0-84938153955

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Adc Built-In-Self-Test Based on a Pseudorandom Uniform Noise Generator

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Adc Built-In-Self-Test Based on a Pseudorandom Uniform Noise Generator

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