Sub-Surface Defect Detection with Motion Induced Eddy Currents in Aluminium

AuthID
 P-00G-FBF
4
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in 2015 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC), ISSN: 1091-5281
Volume: 2015-July, Páginas: 930-934 (5)
Conference
32Nd Annual Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 11-14, 2015, Location: Pisa, ITALY, Patrocinadores: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-84938890783
Wos: WOS:000380587900158
Source Identifiers
ISSN: 1091-5281
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