Nonlinear Characterization Techniques for Improving Accuracy of Gan Hemt Model Predictions in Rf Power Amplifiers

AuthID
 P-00G-HXD
6
Author(s)
Marante, R
·
Garcia, JA
·
Cabria, L
·
Aballo, T
·
Pedro, JC
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in 2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Páginas: 1680-1683 (4)
Conference
Ieee Mtt-S International Microwave Symposium Digest, Date: MAY 23-28, 2010, Location: Anaheim, CA, Patrocinadores: IEEE
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Wos®
Publication Identifiers
Wos: WOS:000288196501191
Source Identifiers
ISSN: 0149-645X
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