Photoelectron Spectroscopy as an in Situ Contact-Less Method for Studies of Mos Properties of Ultrathin Oxides on Si

AuthID
 P-00G-NZB
4
Author(s)
Morgen, P
Tipo de Documento
Article
Year published
2015
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 353, Páginas: 1208-1213 (6)
Indexing
Wos®
Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84941979068
Wos: WOS:000361220700154
Source Identifiers
ISSN: 0169-4332
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