A Method for the In-Circuit Testing of Σδ Modulators

AuthID
 P-00G-Q0S
3
Author(s)
Duarte, JS
·
Tipo de Documento
Proceedings Paper
Year published
2001
Publicado
in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
Páginas: 634-637
Conference
11Th Imeko Tc4 Symposium on Trends in Electrical Measurements and Instrumentation and 6Th Imeko Tc4 Workshop on Adc Modelling and Testing 2001, Date: 13 September 2001 through 14 September 2001
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-84943339831
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