Correlation Of Photoluminescence And Nuclear Characterization Of In-Implanted Silicon

AuthID
P-001-NG5
5
Author(s)
HENRY, MO
·
KEHOE, TB
·
FREITAG, K
·
VIANDEN, R
Tipo de Documento
Article
Year published
1993
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 63, Número: 1-4, Páginas: 232-235 (4)
Conference
Symp On Diagnostic Techniques For Semiconductor Materials Analysis And Fabrication Process Control, At The 1992 Spring Conf Of The European Materials Research Soc, Date: JUN 02-05, 1992, Location: STRASBOURG, FRANCE, Patrocinadores: EUROPEAN MAT RES SOC
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0027240771
Wos: WOS:A1993KF03400043
Source Identifiers
ISSN: 0169-4332
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.