Low Energy Mev Ion Beams, Microscopy and Non-Destructive Surface Analysis of Materials

AuthID
 P-00G-QAC
3
Author(s)
De Carvalho, JP
·
Tipo de Documento
Note
Year published
2015
Publicado
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 21, Número: S5, Páginas: 19-20
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Publication Identifiers
SCOPUS: 2-s2.0-84944028963
Source Identifiers
ISSN: 1431-9276
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