A New Nonlinear Model Extraction Methodology for Gan Hemts Subject to Trapping Effects

AuthID
P-00G-TTH
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in 2015 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Conference
Ieee Mtt-S International Microwave Symposium (Ims), Date: MAY 17-22, 2015, Location: Phoenix, AZ, Patrocinadores: IEEE MTT S
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84946010861
Wos: WOS:000370722900274
Source Identifiers
ISSN: 0149-645X
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