Impurity Lattice Location and Recovery of Structural Defects in Semiconductors Studied by Emission Channeling

AuthID
 P-00H-2K1
3
Author(s)
Jahn, SG
Tipo de Documento
Article
Year published
1994
Publicado
in Hyperfine Interact - Hyperfine Interactions, ISSN: 0304-3834
Volume: 84, Número: 1, Páginas: 27-41
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ISSN: 0304-3834
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