Electron Paramagnetic Resonance of Defects in Doped Microcrystalline Silicon

AuthID
P-00H-65T
7
Author(s)
Lavado, M
·
Guimarães, L
Tipo de Documento
Article
Year published
1989
Publicado
in Vacuum, ISSN: 0042-207X
Volume: 39, Número: 7-8, Páginas: 791-794
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Source Identifiers
ISSN: 0042-207X
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