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In-Situ Study of Ni–Ti Thin Film Growth on a Tin Intermediate Layer by X-Ray Diffraction
AuthID
P-00H-DWN
6
Author(s)
MARTINS, R
·
SCHELL, N
·
SILVA, R
·
PEREIRA, L
·
MAHESH, K
·
FERNANDES, F
Document Type
Article
Year published
2007
Published
in
Sensors and Actuators B: Chemical,
ISSN: 0925-4005
Volume: 126, Issue: 1, Pages: 332-337
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DOI
:
10.1016/j.snb.2006.12.052
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ISSN
: 0925-4005
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