Spectroscopic Ellipsometry Study of Amorphous Silicon Anodically Oxidised

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P-00H-FB2
6
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Tipo de Documento
Article
Year published
2003
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in Thin Solid Films, ISSN: 0040-6090
Volume: 427, Número: 1-2, Páginas: 345-349
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ISSN: 0040-6090
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