Gold Layers Characterization by Ion Beam Analytical Techniques: from Semiconductors to Cultural Heritage Artefacts

AuthID
 P-00H-H9E
2
Author(s)
Alves, L
Tipo de Documento
Article
Year published
2015
Publicado
in Microscopy and Microanalysis - Microsc Microanal, ISSN: 1431-9276
Volume: 21, Número: S6, Páginas: 100-101
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ISSN: 1431-9276
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