Determination of the D 0/− Level in Amorphous Si,Ge:h(F) by Time-Of-Flight Charge Collection

AuthID
 P-00H-MHC
8
Author(s)
Shen, DS
·
Liu, JZ
·
Aljishi, S
·
Smith, ZE
·
Maruyama, A
·
Wagner, S
Tipo de Documento
Article
Year published
1988
Publicado
in Appl. Phys. Lett. - Applied Physics Letters, ISSN: 0003-6951
Volume: 53, Número: 16, Páginas: 1542
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ISSN: 0003-6951
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