In Vivo Measurement of the Brain and Skull Resistivities Using an Eit-Based Method and the Combined Analysis of Sef/Sep Data

AuthID
 P-00H-TH0
5
Author(s)
de Munck, J
·
Verbunt, J
·
Heethaar, R
·
Lopes da Silva, F
Tipo de Documento
Article
Year published
2003
Publicado
in IEEE Transactions on Biomedical Engineering - IEEE Trans. Biomed. Eng., ISSN: 0018-9294
Volume: 50, Número: 9, Páginas: 1124-1128
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ISSN: 0018-9294
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