Noninvasive Electrical Characterization of Semiconductor at Bulk and Interfaces

AuthID
 P-00H-X56
7
Author(s)
Vanderhaghen, R
·
Kasouit, S
·
Kim, H
·
Kleider, JP
2
Editor(es)
Razeghi, Manijeh; Brown, Gail J.
Tipo de Documento
Proceedings Paper
Year published
2003
Publicado
in Quantum Sensing: Evolution and Revolution from Past to Future
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service