Assessment of Residual Stress on Thin Films by Laser Microtopography

AuthID
 P-00H-XKF
2
Author(s)
2
Editor(es)
Rodríguez-Vera, Ramón; Díaz-Uribe, Rufino
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in 22nd Congress of the International Commission for Optics: Light for the Development of the World
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