Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling

AuthID
 P-00H-ZE8
11
Author(s)
Pantelides, ST
·
Tsetseris, L
·
Beck, MJ
·
Rashkeev, SN
·
Hadjisavvas, G
·
Batyrev, I
·
Tuttle, B
·
Zhou, X
·
Fleetwood, DM
·
Schrimpf, R
Tipo de Documento
Proceedings Paper
Year published
2009
Publicado
in ECS Transactions
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