A-Si:h Ambipolar Diffusion Length and Effective Lifetime Measured by Flying Spot Technique (Fst)

AuthID
 P-00J-2AB
5
Author(s)
Vieira, M
·
Martins, R
·
Soares, F
·
Guimaraes, L
Tipo de Documento
Article
Year published
1991
Publicado
in MRS Proc. - MRS Proceedings, ISSN: 1946-4274
Volume: 219
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Source Identifiers
ISSN: 1946-4274
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