A Perturbation Approach to the Analysis of Index Ellipsoid Deformations in Biaxial and Uniaxial Media

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 P-00J-7RF
1
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Article
Year published
1993
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in Microwave and Optical Technology Letters - Microw. Opt. Technol. Lett., ISSN: 0895-2477
Volume: 6, Número: 11, Páginas: 657-660
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ISSN: 0895-2477
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