Experimental Analysis of Outage Times for Profibus Networks

AuthID
 P-000-5W8
3
Author(s)
Carvalho, JA
·
4
Editor(es)
Franquelo,LG;Malinowski,A;Chow,MY;Hess,HL
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in IECON 2005: THIRTY-FIRST ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-3 in IEEE Industrial Electronics Society, ISSN: 1553-572X
Volume: 2005, Páginas: 421-426 (6)
Conference
31St Annual Conference of the Ieee-Industrial-Electronics-Society, Date: NOV 06-10, 2005-2006, Location: Raleigh, NC, Patrocinadores: IEEE Ind Elect Soc, NORTEL, Schneider Elect, SICE, NC State Univ, IEEE, Adv Energy, Celisca, NUCOR, EATON
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Publication Identifiers
SCOPUS: 2-s2.0-33749662161
Wos: WOS:000236873600074
Source Identifiers
ISSN: 1553-572X
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