Field Emission Interferometry with the Scanning Tunneling Microscope

AuthID
P-00J-H6G
8
Author(s)
Caamaño, A
·
Custance, O
·
Méndez, J
·
Baró, A
·
Veuillen, J
·
Gómez-Rodrı́guez, J
·
Sáenz, J
Tipo de Documento
Article
Year published
1999
Publicado
in Surface Science, ISSN: 0039-6028
Volume: 426, Número: 1, Páginas: L420-L425
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Publication Identifiers
Source Identifiers
ISSN: 0039-6028
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