Photoconductive Analysis of Defect Density of Hydrogenated Amorphous Silicon During Room-Temperature Plasma Posthydrogenation, Light Soaking, and Thermal Annealing

AuthID
 P-00J-P3P
5
Author(s)
Gonçalves, M
·
Brogueira, P
·
Schotten, V
·
Chu, V
Tipo de Documento
Article
Year published
1996
Publicado
in Phys. Rev. B - Physical Review B, ISSN: 0163-1829
Volume: 53, Número: 4, Páginas: 1886-1890
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ISSN: 0163-1829
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