Infrared Ellipsometry and Near-Infrared-To-Vacuum-Ultraviolet Ellipsometry Study of Free-Charge Carrier Properties in In-Polar P-Type Inn

AuthID
 P-00J-V3A
7
Author(s)
Hofmann, T
·
Wang, X
·
Yoshikawa, A
·
Schubert, M
Tipo de Documento
Article
Year published
2012
Publicado
in MRS Proc. - MRS Proceedings, ISSN: 1946-4274
Volume: 1396
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Source Identifiers
ISSN: 1946-4274
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