A Technique to Reduce On-Wafer Measurement Uncertainty for Cmos Transmission Line Characterization

AuthID
 P-00J-Z90
3
Author(s)
Assuncao, M
·
Freire, JC
Tipo de Documento
Article
Year published
2015
Publicado
in IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, ISSN: 1531-1309
Volume: 25, Número: 12, Páginas: 829-831 (3)
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Publication Identifiers
SCOPUS: 2-s2.0-84946761025
Wos: WOS:000366967800022
Source Identifiers
ISSN: 1531-1309
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