Depth Profiling And Diffusion Of Ne-22 Implanted In Tantalum By (P, Gamma) Resonance Broadening

AuthID
P-001-XG2
4
Author(s)
DASILVA, MF
·
MELO, AA
·
FREITAG, K
·
Tipo de Documento
Article
Year published
1983
Publicado
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, ISSN: 0029-554X
Volume: 209, Número: MAY, Páginas: 889-893 (5)
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Publication Identifiers
Wos: WOS:A1983QV21300042
Source Identifiers
ISSN: 0029-554X
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