Embedding Fault List Compression Techniques in a Design Automation Framework for Analog and Mixed-Signal Structural Testing

AuthID
 P-00K-DPQ
5
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in 2015 Conference on Design of Circuits and Integrated Systems (DCIS)
Conference
2015 Conference on Design of Circuits and Integrated Systems (Dcis), Date: NOV 25-27, 2015, Location: Estoril, PORTUGAL
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84963807779
Wos: WOS:000380543200029
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service