Publicações

Delay Sensing for Parametric Variations and Defects Monitoring in Safety-Critical Applications

AuthID
P-00K-EET

Author(s)

Vazquez, JC

Champac, V

Ziesemer, AM

Reis, R

Teixeira, IC

Santos, MB

Teixeira, JP

Tipo de Documento

Proceedings Paper

Year published

2010

Publicado

in Proceedings - 2010 1st IEEE Latin American Symposium on Circuits and Systems, LASCAS 2010

Páginas: 148-151

Conference

1St Ieee Latin American Symposium on Circuits and Systems, Lascas 2010, Date: 24 February 2010 through 26 February 2010, Patrocinadores: Brazillian Computer Society (SBC);Brazillian Microelectronics Society (SBMicro);IEEE;IEEE Circuits and Systems Society (CASS)

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