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3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

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P-00K-J91

Author(s)

Boularas, A

Baudoin, F

Teyssedre, G

Villeneuve Faure, C

Clain, S

Tipo de Documento

Article

Year published

2016

Publicado

in IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, ISSN: 1070-9878

Volume: 23, Número: 2, Páginas: 705-712 (8)

Conference

9Th Conference of the French-Society-Of-Electrostatics, Date: AUG 27-29, 2014, Location: Toulouse, FRANCE, Patrocinadores: French Soc Electrostat, Paul Sabatier Univ, Lab Plasma & Energy Convers, French Natl Ctr Sci Res

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Publication Identifiers

DOI: 10.1109/tdei.2016.005341

SCOPUS: 2-s2.0-84973484186

Wos: WOS:000377461500013

Source Identifiers

ISSN: 1070-9878

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3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

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3D Modeling of Electrostatic Interaction Between Atomic Force Microscopy Probe and Dielectric Surface: Impact of Tip Shape and Cantilever Contribution

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