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A Comparative Analysis Between Genetic Algorithms and Complex Nonlinear Least Squares on Electrical Impedance Characterization

AuthID
P-00K-PY9

Author(s)

Janeiro, FM

Ramos, PM

Tipo de Documento

Proceedings Paper

Year published

2016

Publicado

in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281

Volume: 2016-July

Conference

2016 Ieee International Instrumentation and Measurement Technology Conference, I2Mtc 2016, Date: 23 May 2016 through 26 May 2016, Patrocinadores: IEEE;IEEE Instrumentation and Measurement Society

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Fontes

Publication Identifiers

DOI: 10.1109/i2mtc.2016.7520552

SCOPUS: 2-s2.0-84980384017

Source Identifiers

ISSN: 1091-5281

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A Comparative Analysis Between Genetic Algorithms and Complex Nonlinear Least Squares on Electrical Impedance Characterization

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