High Immunity Wafer-Level Measurement of Mhz Current

AuthID
 P-00K-T3G
6
Author(s)
Dąbek, M
·
Kalabiński, P
·
Wrona, J
·
Tipo de Documento
Article
Year published
2016
Publicado
in Measurement: Journal of the International Measurement Confederation, ISSN: 0263-2241
Volume: 94, Páginas: 474-479
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Publication Identifiers
SCOPUS: 2-s2.0-84983757566
Source Identifiers
ISSN: 0263-2241
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