Svm Classification of Thickness and Lift-Off Using Transient Eddy Current Oscillation Method

AuthID
 P-00K-WW4
4
Author(s)
Angani, CS
·
Tipo de Documento
Proceedings Paper
Year published
2016
Publicado
in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
Páginas: 579-584 (6)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 23-26, 2016, Location: Taipei, TAIWAN, Patrocinadores: IEEE, IEEE Instrumentat & Measurement Soc, NAR Labs, Instrumetn Technol Res Ctr, TRIOPTICS Taiwan, HsintekOptics, BASO Precis Opt Ltd, Ind Technol Res Inst, YINSH, T & U, Lumos Technol Co Ltd, Zimmerman Sci Co Ltd, CMOS Sensor Inc, arn, Keysight Technologies, Zurich Instrumetns, Samwell Testing Inc
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Publication Identifiers
Wos: WOS:000382523600103
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