Charge Trapping Properties and Retention Time in Amorphous Sige/Sio2 Nanolayers

AuthID
P-002-01H
9
Author(s)
Vieira, EMF
·
Diaz, R
·
Grisolia, J
·
Parisini, A
·
Martin Sanchez, J
·
Tipo de Documento
Article
Year published
2013
Publicado
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 46, Número: 9, Páginas: 095306 (5)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84874039274
Wos: WOS:000314819500024
Source Identifiers
ISSN: 0022-3727
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