Image Pos-Processing and Inversion for Eddy Current Crack Detection Problems

AuthID
 P-00M-4K3
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2016
Publicado
in 2016 IEEE METROLOGY FOR AEROSPACE (METROAEROSPACE)
Páginas: 203-208 (6)
Conference
3Rd Ieee International Workshop on Metrology for Aerospace (Metroaerospace), Date: JUN 21-23, 2016, Location: Univ Studi Firenze, Florence, ITALY, Patrocinadores: IEEE, IEEE Instrumentat & Measurement Soc, IEEE AESS, Host: Univ Studi Firenze
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84991810699
Wos: WOS:000389769800038
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service