Evaluating the Effects of Single Event Upsets in Soft-Core Gpgpus

AuthID
 P-00M-7D3
3
Author(s)
Nedel, W
·
Azambuja, JR
Tipo de Documento
Proceedings Paper
Year published
2016
Publicado
in 2016 17TH IEEE LATIN-AMERICAN TEST SYMPOSIUM (LATS)
Páginas: 93-98 (6)
Conference
17Th Ieee Latin-American Test Symposium (Lats), Date: APR 06-08, 2016, Location: Foz do Iguacu, BRAZIL, Patrocinadores: IEEE, IEEE Council Elect Design Automat, IEEE Test Technol Tech Council
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Publication Identifiers
Wos: WOS:000386790400020
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