Investigations of Space Charge Distributions by Atomic Force Microscope

AuthID
 P-00M-BBM
3
Author(s)
Kliem, H
·
Tipo de Documento
Proceedings Paper
Year published
2016
Publicado
in 2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD), VOLS 1-2
Páginas: 219-222 (4)
Conference
Ieee International Conference on Dielectrics (Icd), Date: JUL 03-07, 2016, Location: Montpellier, FRANCE, Patrocinadores: IEEE, IEEE Dielectr & Elect Insulat Soc, Univ Montpellier, Inst Elect Systemes, Grp Energie Materiaux, CNRS
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Publication Identifiers
Wos: WOS:000389639800055
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