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The Metrology System of the Vlti Instrument Gravity
AuthID
P-00M-BEY
P-00M-BEY
27
Author(s)
Lippa, M
·Gillessen, S
·Blind, N
·Kok, Y
·Yazici, S
·Weber, J
·Pfuhl, O
·Haug, M
·Kellner, S
·Wieprecht, E
·[+7]·
Plattner, M
·Rau, C
·Sturm, E
·Waisberg, I
·Wiezorrek, E
·Perrin, G
·Perraut, K
·Brandner, W
·Straubmeier, C
·
3
Editor(es)
Malbet,F;Creech-Eakman,MJ;Tuthill,PG
Tipo de Documento
Proceedings Paper
Year published
2016
Publicado
in OPTICAL AND INFRARED INTERFEROMETRY AND IMAGING V in Proceedings of SPIE, ISSN: 0277-786X
Volume: 9907
Conference
Conference on Optical and Infrared Interferometry and Imaging V, Date: JUN 27-JUL 01, 2016, Location: Edinburgh, SCOTLAND, Patrocinadores: SPIE
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ISSN: 0277-786X
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| Name Order | Nome | Name Order | Nome | Name Order | Nome | ||
|---|---|---|---|---|---|---|---|
| 1 | Lippa, M; | 2 | Gillessen, S; | 3 | Blind, N; | ||
| 4 | Kok, Y; | 5 | Yazici, S; | 6 | Weber, J; | ||
| 7 | Pfuhl, O; | 8 | Haug, M; | 9 | Kellner, S; | ||
| 10 | Wieprecht, E; | 11 | Eisenhauer, F; | 12 | Genzel, R; | ||
| 13 | Hans, O; | 14 | Haussmann, F; | 15 | Huber, D; | ||
| 16 | Kratschmann, T; | 17 | Ott, T; | 18 | Plattner, M; | ||
| 19 | Rau, C; | 20 | Sturm, E; | 21 | Waisberg, I; | ||
| 22 | Wiezorrek, E; | 23 | Perrin, G; | 24 | Perraut, K; | ||
| 25 | Brandner, W; | 26 | Straubmeier, C; | 27 | Amorim, A; |
