Non-Destructive Surface Analysis of Materials by Mev Ion Beams, Microscopy and Computer Simulation

AuthID
 P-00M-H4J
3
Author(s)
Pacheco De Carvalho, J
·
Pacheco, CFR
·
Tipo de Documento
Note
Year published
2016
Publicado
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 22, Número: S4, Páginas: 42-43
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85014444647
Source Identifiers
ISSN: 1431-9276
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2025 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service