Deposition Parameters and Annealing Key Role in Setting Structural and Polar Properties of Bi0.9La0.1Fe0.9Mn0.1O3 Thin Films

AuthID
 P-00M-SQZ
8
Author(s)
Carvalho, TT
·
Perez de la Cruz, JP
·
Tipo de Documento
Article
Year published
2017
Publicado
in JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, ISSN: 0957-4522
Volume: 28, Número: 17, Páginas: 12690-12697 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-85019190605
Wos: WOS:000407946700038
Source Identifiers
ISSN: 0957-4522
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