Residual Stress Effects on Raman Spectra of Ruo2 Thin Films

AuthID
 P-000-6PV
5
Author(s)
Cui, HN
·
9
Editor(es)
Denis, S; Hanabusa, T; He, BP; Mittemeijer, E; Nan, J; Noyan, IC; Scholtes, B; Tanaka, K; Xu, KW
Tipo de Documento
Article
Year published
2005
Publicado
in RESIDUAL STRESSES VII, PROCEEDINGS in MATERIALS SCIENCE FORUM, ISSN: 0255-5476
Volume: 490-491, Páginas: 583-588 (6)
Conference
7Th International Conference Onresidual Strsses (Icrs-7), Date: JUN 14-17, 2004, Location: Xian, PEOPLES R CHINA, Patrocinadores: Chinese Mech Engn Soc, Xian Jiaotong Univ
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-35148870063
Wos: WOS:000230305200100
Source Identifiers
ISSN: 0255-5476
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