Measurement of Residual Stress in Multicrystalline Silicon Ribbons by a Self-Calibrating Infrared Photoelastic Method

AuthID
 P-000-6PX
5
Author(s)
Tipo de Documento
Article
Year published
2005
Publicado
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 76, Número: 1, Páginas: 013901-1-013901-6 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-19744383862
Wos: WOS:000226738300025
Source Identifiers
ISSN: 0034-6748
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