Towards High-Resolution Scanning Magnetoresistance Microscopy

AuthID
P-00N-3H4
6
Author(s)
Costa, M
·
Tarequzzaman, M
·
Ferreira, R
·
Gaspar, J
·
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in 2017 IEEE 12TH INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (NEMS)
Páginas: 73-76 (4)
Conference
12Th Ieee Annual International Conference on Nano/Micro Engineered and Molecular Systems (Ieee-Nems), Date: APR 09-12, 2017, Location: Los Angeles, CA, Patrocinadores: IEEE, IEEE Nanotechnol Council
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Publication Identifiers
SCOPUS: 2-s2.0-85030833136
Wos: WOS:000425214800135
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