Test Preparation Methodology for High Covemge of Physical Defects in Cmos Digital Ics

AuthID
 P-00N-3PY
4
Author(s)
Simges, M
·
Teixeira, I
·
Teixeira, JP
Tipo de Documento
Proceedings Paper
Year published
1995
Publicado
in Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
Páginas: 604
Conference
1995 European Conference on Design and Test, Edtc 1995, Date: 6 March 1995 through 9 March 1995, Patrocinadores: ACM Special Interest Group on Design Automation (SIGDA)
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-85030535503
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