Bi-Te Thin Film Produced by Ion Beam Sputtering: Impact of Beam Voltage in the Seebeck Coefficient

AuthID
 P-00N-989
5
Author(s)
Cruz, IF
·
Ferreira Teixeira, S
·
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in MATERIALS TODAY-PROCEEDINGS, ISSN: 2214-7853
Volume: 4, Número: 12, Páginas: 12383-12390 (8)
Conference
Emrs Spring Meeting / Symposium H on Inorganic Thermoelectrics - Linking Material Properties and Systems Engineering for Xxi Century Applications, Date: MAY 22-26, 2017, Location: Strasbourg, FRANCE, Patrocinadores: EMRS
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Publication Identifiers
SCOPUS: 2-s2.0-85034243868
Wos: WOS:000416620400007
Source Identifiers
ISSN: 2214-7853
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