Electron Backscatter Diffraction Analysis of Zno:al Thin Films

AuthID
 P-002-4E5
4
Author(s)
Villechaise, P
Tipo de Documento
Article
Year published
2012
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 259, Páginas: 590-595 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-84866010005
Wos: WOS:000310436900089
Source Identifiers
ISSN: 0169-4332
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