From System Level to Defect-Oriented Test: A Case Study

AuthID
 P-00N-G46
5
Author(s)
Dias, OP
·
Santos, MB
·
Teixeira, IM
·
Teixeira, JP
Tipo de Documento
Proceedings Paper
Year published
1999
Publicado
in Proceedings - European Test Workshop 1999, ETW 1999
Páginas: 136-141
Conference
1999 European Test Workshop, Etw 1999, Date: 25 May 1999 through 28 May 1999, Patrocinadores: IEEE Computer Society;University of Stuttgart
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Publication Identifiers
SCOPUS: 2-s2.0-85040087919
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