Ect with Uniform Current Distribution for the Inspection of Sub-Surface Cracks in Conductive Plates

AuthID
 P-00N-JPC
3
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in 15th IMEKO TC10 Workshop on Technical Diagnostics 2017 - "Technical Diagnostics in Cyber-Physical Era"
Páginas: 160-163
Conference
15Th Imeko Tc10 Workshop on Technical Diagnostics 2017: Technical Diagnostics in Cyberphysical Era, Date: 6 June 2017 through 7 June 2017, Patrocinadores: AQ Anton;Opel
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-85041174513
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