Competitive and Cost Effective Copper/Low-K Interconnect (Beol) for 28 Nm Cmos Technologies

AuthID
P-00N-QT4
59
Author(s)
Augur, R
·
Child, C
·
Ahn, JH
·
Tang, TJ
·
Clevenger, L
·
Kioussis, D
·
[+3]·
[+9]·
[+1]·
[+10]·
[+2]·
[+5]·
[+5]·
[+4]·
Restaino, D
·
Molis, S
·
Spooner, T
·
Sampson, R
Tipo de Documento
Proceedings Paper
Year published
2012
Publicado
in Microelectronic Engineering, ISSN: 0167-9317
Volume: 92, Páginas: 42-44
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84858283634
Source Identifiers
ISSN: 0167-9317
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Name Order Nome   Name Order Nome   Name Order Nome
1 Augur, R;   2 Child, C;   3 Ahn, JH;
4 Tang, TJ;   5 Clevenger, L;   6 Kioussis, D;
7 Masuda, H;   8 Srivastava, R;   9 Oda, Y;
10 Oguma, H;   11 Quon, R;   12 Kim, B;
13 Sheng, H;   14 Hirooka, S;   15 Gupta, R;
16 Thomas, A;   17 Singh, SM;   18 Fang, Q;
19 Schiwon, R;   20 Hamieh, B;   21 Wornyo, E;
22 Allen, S;   23 Kaltalioglu, E;   24 Ribes, G;
25 Zhang, G;   26 Fryxell, T;   27 Ogino, A;
28 Shimada, E;   29 Aizawa, H;   30 Minda, H;
31 Kim, SO;   32 Oki, T;   33 Fujii, K;
34 Pallachalil, M;   35 Takewaki, T;   36 Hu, CK;
37 Sundlof, B;   38 Permana, D;   39 Bolom, T;
40 Engel, B;   41 Labelle, C;   42 Sapp, B;
43 Nogami, T;   44 Simon, A;   45 Shobha, H;
46 Gates, S;   47 Ryan, ET;   48 Bonilla, G;
49 Daubenspeck, T;   50 Shaw, T;   51 Osborne, G;
52 Grill, A;   53 Edelstein, D;   54 Restaino, D;
55 Molis, S;   56 Spooner, T;   57 Ferreira, P ;
58 Biery, G;   59 Sampson, R;