Publicações

Derivation of the Near-Surface Dielectric Function of Amorphous Silicon from Photoelectron Loss Spectra

AuthID
P-002-5RX

Author(s)

David, D

Godet, C

Sabbah, H

Ababou Girard, S

Solal, F

Chu, V

Conde, JP

Tipo de Documento

Article

Year published

2012

Publicado

in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093

Volume: 358, Número: 17, Páginas: 2019-2022 (4)

Conference

24Th International Conference on Amorphous and Nanocrystalline Semiconductors (Icans), Date: AUG 21-26, 2011, Location: Nara, JAPAN, Patrocinadores: Japan Soc Promot Sci, 147th Comm Amorphous & Nanocrystalline Mat, Commemorat Org Japan World Expositi, Osaka Univ Global COE Program Core Res & Engn Adv Mat Interdisciplinary Educ Ctr Mat Sci, Asahi Glass Fdn, ALS Tech Co Ltd, Crev Inc, Coherent Inc, DAIHEN Corp, Dainippon Screen Co Ltd, HOYA Corp, J A Woollam Co Inc, Kaneka Corp, KEYENCE Corp, Mitsubishi Heavy Ind Ltd, Nano Photon, Nisshin Steel Co Ltd, Samco Inc, Sanyo Elect Co Ltd, Semicond Energy Lab Co Ltd, Shimadzu Corp, SNK Corp, Tokyo Elect Ltd, TOYO Corp, ULVAC Inc

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